Class 'OM_Process' (related to OM_Observation via the 'Procedure' Association) is used to define the process(es) involved in generating an observation. An instance of OM_Process is often an instrument or sensor (perhaps even a sensor in a given calibrated state), but it may be a human observer executing a set of instructions, a simulator or process algorithm. The 'Procedure' should provide sufficient information to interpret the result of an observation; thus if a sensor is recalibrated or its height above local ground is changed, a new instance of OM_Process should be created and associated with subsequent observations from that sensor (at least until the sensor is changed again).<br /></p><p><br /></p><p>Predominantly we expect the Process instance to be externally published / defined and 'static' (e.g. perhaps changing less often than once per month due to amendments to operational protocols etc.).<br /></p><p><br /></p><p>The class 'Process' provides a concrete implementation of OM_Process (from ISO 19156).<br /></p><p><br /></p><p>The implementation is intended to support the following requirements:<br /></p><p>1) reference to supporting documentation (ProcessDocumentation); e.g. online documentation describing the procedure in detail;<br /></p><p>2) specification of parameters that remain fixed within a particular configuration of the procedure (Configuration); a soft-typed approach is used here following the pattern adopted for OM_Observation/parameter;<br /></p><p>3) specification of the resolution [1] with which each observed physical phenomenon is measured; and<br /></p><p>4) specification of the measuring interval [2] of the instrument or sensor for each observed physical phenomenon.<br /></p><p><br /></p><p>[1] Resolution: smallest change in a quantity being measured that causes a perceptible change in the corresponding indication (from the 'International vocabulary of metrology' [http://www.bipm.org/utils/common/documents/jcgm/JCGM_200_2008.pdf])<br /></p><p>[2] Measuring interval: set of values of quantities of the same kind that can be measured by a given measuring instrument or measuring system with specified instrumental uncertainty, under defined conditions (from the 'International vocabulary of metrology' [http://www.bipm.org/utils/common/documents/jcgm/JCGM_200_2008.pdf])<br /></p>